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Proceedings Paper

An application of active optics to x-ray imaging: X-mas (x-ray milli arc-second) project
Author(s): Masahiro Tsujimoto; Shunji Kitamoto; Yohsuke Ohkubo; Jun'ichi Sato; Takeshi Watanabe; Keisuke Sudoh; Akiko Sekiguchi; Kazuharu Suga; Hiroyuki Sekiguchi
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Paper Abstract

We report the current status of the "X-mas" (X-ray milli-arcsecond) project. X-mas is an application of the AO technology to the X-ray optics, aiming to obtain high-resolution defraction-limited X-ray images. Our X-ray telescope employs the Newton optics with a paraboloid primary and a 31-element deformable secondary mirrors. The aperture of the primary mirror is 80 millimeters with the focal length of 2 meters. Multi-layer coating of the mirrors by silicon and molybdenum realizes a large reflectivity of ~60% for the primary and 30-50% for the secondary mirror at 13.5 nm, which enables us to construct a normal incidence optics at this wavelength. We use a laser guide source and a wave front sensor to optimize the form of the secondary deformable mirror for the purpose of offsetting the large-scale figure errors in the X-ray optics. A back-side illumination X-ray CCD detector manufactured by Hamamatsu Photonics is used for X-ray detections. We have assembled all these elements and started to accumulate data. Closed-loop AO is in operation for the laser guide source. Likely X-ray images are obtained through the telescope. The results in 2005-2006 are presented.

Paper Details

Date Published: 28 June 2006
PDF: 8 pages
Proc. SPIE 6272, Advances in Adaptive Optics II, 62724T (28 June 2006); doi: 10.1117/12.670937
Show Author Affiliations
Masahiro Tsujimoto, Rikkyo Univ. (Japan)
Shunji Kitamoto, Rikkyo Univ. (Japan)
Yohsuke Ohkubo, Rikkyo Univ. (Japan)
Jun'ichi Sato, Rikkyo Univ. (Japan)
Takeshi Watanabe, Rikkyo Univ. (Japan)
Keisuke Sudoh, Rikkyo Univ. (Japan)
Akiko Sekiguchi, Rikkyo Univ. (Japan)
Kazuharu Suga, Rikkyo Univ. (Japan)
Hiroyuki Sekiguchi, Rikkyo Univ. (Japan)

Published in SPIE Proceedings Vol. 6272:
Advances in Adaptive Optics II
Brent L. Ellerbroek; Domenico Bonaccini Calia, Editor(s)

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