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Proceedings Paper

Silicon microspheres
Author(s): Ali Serpengüzel
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Paper Abstract

Morphology-dependent resonances are observed in silicon microspheres, both in the transmission and elastic scattering spectra in the O-band. Approximately 23% of the power is coupled out at the resonance wavelength. The highest observed quality factor for the morphology dependent resonances was on the order of 105. These resonances have a linewidth of 0.007 nm and a mode spacing of 0.19 nm.

Paper Details

Date Published: 22 February 2006
PDF: 4 pages
Proc. SPIE 6101, Laser Beam Control and Applications, 61010K (22 February 2006); doi: 10.1117/12.669575
Show Author Affiliations
Ali Serpengüzel, Koç Univ. (Turkey)


Published in SPIE Proceedings Vol. 6101:
Laser Beam Control and Applications
Steven J. Davis; Alexis V. Kudryashov; Adolf Giesen; Detlef Nickel; Michael C. Heaven; Alan H. Paxton; Vladimir S. Ilchenko; J. Thomas Schriempf, Editor(s)

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