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Proceedings Paper

Faint flux performance of an EMCCD
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Paper Abstract

Thorough numerical simulations were run to test the performance of three processing methods of the data coming out from an electron multiplying charge coupled device (EMCCD), or low light level charge coupled device (L3CCD), operated at high gain, under real operating conditions. The effect of read-out noise and spurious charges is tested under various low flux conditions (0.001 event/pixel/frame< f < 20 events/pixel/frame). Moreover, a method for finding the value of the gain applied by the EMCCD amplification register is also developed. It allows one to determine the gain value to an accuracy of a fraction of a percent from dark frames alone.

Paper Details

Date Published: 15 June 2006
PDF: 9 pages
Proc. SPIE 6276, High Energy, Optical, and Infrared Detectors for Astronomy II, 62761F (15 June 2006); doi: 10.1117/12.669433
Show Author Affiliations
Olivier Daigle, Univ. de Montréal (Canada)
Photon etc. (Canada)
Claude Carignan, Univ. de Montréal (Canada)
Sébastien Blais-Ouellette, Photon etc. (Canada)

Published in SPIE Proceedings Vol. 6276:
High Energy, Optical, and Infrared Detectors for Astronomy II
David A. Dorn; Andrew D. Holland, Editor(s)

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