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Proceedings Paper

OASIS: cryogenically-optimized resistive arrays and IRSP subsystems for space-background IR simulation
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Paper Abstract

SBIR has completed design and development of prototype emitter arrays and is completing custom cryogenic vacuum device packaging and support electronics for the Optimized Arrays for Space-background Infrared Simulation (OASIS) program. The OASIS array is a 512 x 512 device featuring high output dynamic range, a selectable analog/digital scene data interface, and the capability to operate from cryogenic to ambient substrate temperatures - thereby providing an enabling technology for projection of simulated radiance of space-background scenes. Prototype emitter production has been completed at RTI International in support of initial deliveries. The OASIS array package incorporates novel electrical bussing schemes optimized for the OASIS RIIC and a modular architecture to allow user re-configuration of both window and emitter shield. The OASIS package leverages LFRA operation features, and supports both ambient and cryogenic chamber-based operation with a minimum of mechanical and electrical re-configuration. The OASIS close support electronics (CSE) supports both analog and digital input data modes, while providing easy electronic connection between arrays installed in the cryogenic chamber and the external control and scene-generation systems. We present a technical overview of the OASIS array/package and CSE designs, and will report on measured radiometric performance from prototype OASIS arrays.

Paper Details

Date Published: 16 May 2006
PDF: 9 pages
Proc. SPIE 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI, 620812 (16 May 2006); doi: 10.1117/12.669302
Show Author Affiliations
Jay James, Santa Barbara Infrared, Inc. (United States)
Paul Bryant, Left Coast Consulting (United States)
Steve Solomon, Acumen Scientific (United States)
Joe LaVeigne, Santa Barbara Infrared, Inc. (United States)
Greg Matis, Santa Barbara Infrared, Inc. (United States)
Jim Oleson, Santa Barbara Infrared, Inc. (United States)
John Lannon, RTI International (United States)
Scott Goodwin, RTI International (United States)
Alan Huffman, RTI International (United States)

Published in SPIE Proceedings Vol. 6208:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
Robert Lee Murrer Jr., Editor(s)

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