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Proceedings Paper

Image resolution influence on determination of resin injection rock mass
Author(s): Weixing Wang; Eva Hakami
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Paper Abstract

In the context of nuclear waste repositories, an important approach to understanding brittle rock mass behavior to integrate new and powerful observational and numerical methods with multi-functional 3-D imaging and visualization techniques. Since 1994, Swedish Nuclear Fuel and Waste Management Company (SKB) have identified the need for a better understanding of radionuclide transport and retention processes in fractured rock. As a cooperation project between Sweden and China, we sampled a number of rock specimens for analyze rock fracture network by optical image technique. The samples are resin injected, in which way; opened fractures can be seen clearly by means of UV (Ultraviolet) light illumination. In the study period, we used different optical focuses to obtain the images from the same samples; we found that Image resolution influences on porosity determination of resin injected rock mass. This paper presents and discusses the six issues based on our research results: (1) Fracture porosity increases as camera focus distance decreases; (2) Porosity increases as illumination increases in resin injected fracture images; (3) To roughly estimate the porosity, the low resolution image can be used; (4) To collect more details of fracture information, the high resolution image is needed; (5) The resolution of image should be determined based on the aim of fracture analysis; (6) To acquire high resolution image, constructing a special illumination (standard) box maybe helpful to avoid light reflection and diffusion.

Paper Details

Date Published: 20 January 2006
PDF: 12 pages
Proc. SPIE 6027, ICO20: Optical Information Processing, 602719 (20 January 2006); doi: 10.1117/12.667942
Show Author Affiliations
Weixing Wang, Chongqing Univ. of Posts and Telecommunications (China)
ITASCA Geomekanik AB (Sweden)
Eva Hakami, ITASCA Geomekanik AB (Sweden)

Published in SPIE Proceedings Vol. 6027:
ICO20: Optical Information Processing
Yunlong Sheng; Songlin Zhuang; Yimo Zhang, Editor(s)

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