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Proceedings Paper

Detection system for film
Author(s): Jin-jiang Wang; Wen-yao Liu; Li Ren; Xu-tao Mo; Bing-zhen Wang
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Paper Abstract

Film is one kind of important record median. Its quality will affect image quality directly. So, it is necessary to study how to assure its quality. Because the situation of film production in dark room, normal detect method could not satisfied the film. In order to avoid to damage film, an infrared detect system is studied. This system is design to set at the position of spreader head. If the defect of film could be found at this position, the beginner of film production line, worker could tread with it in time and reduce waster. The infrared detect system include two sub systems. The two sub system need to detect one position all the time. One sub system is used to detect if there is defect. One CCD camera captures film image. The film image will be monitor by worker through screen. The screen should be set in light room. Another sub system is composed of object lens, image intensifier micro-channel plate and eye lens. If worker find defect from screen, he will inform another worker who worker in dark room. Another worker could find the defect through image intensifier system, and treat with it. The communication method between two workers is sound, not alarm light, because there is dark room. All of the two sub systems use infrared light as light source. The wavelength of light source is 940 nm, which is safe to film. This system is designed for Lekai, the biggest film company of China. This system could find detect early and help worker to deal with it on site, because the detect position is the starting of film production line.

Paper Details

Date Published: 9 December 2005
PDF: 6 pages
Proc. SPIE 6024, ICO20: Optical Devices and Instruments, 602419 (9 December 2005); doi: 10.1117/12.666854
Show Author Affiliations
Jin-jiang Wang, Tianjin Univ. (China)
Wen-yao Liu, Tianjin Univ. (China)
Li Ren, Tianjin Univ. (China)
Xu-tao Mo, Tianjin Univ. (China)
Bing-zhen Wang, Tianjin Univ. (China)

Published in SPIE Proceedings Vol. 6024:
ICO20: Optical Devices and Instruments
James C. Wyant; X. J. Zhang, Editor(s)

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