
Proceedings Paper
Anomaly detection using the hyperspectral polarimetric imaging testbedFormat | Member Price | Non-Member Price |
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Paper Abstract
The Hyperspectral Polarimetric Imaging Testbed contains a VNIR, SWIR, and three-axis
imaging polarimeter, each operating simultaneously through a common fore-optic. The
system was designed for the detection of man-made objects in natural scenes. The
imagery produced by the various imaging legs of the system is readily fused, due to the
identical image format, FOV and IFOV of each optical leg. The fused imagery is shown
to be useful for the detection of a variety of man-made surfaces. This paper describes the
general design and function of the mature system, the Stochastic Gaussian Classifier
processing method used for hyperspectral anomaly detection, the polarimetric image
processing methods, and a logical decision structure for the identification of various
surface types. The paper will also describe in detail the detection results for a variety of
targets obtained in field testing conducted with the system.
Paper Details
Date Published: 4 May 2006
PDF: 13 pages
Proc. SPIE 6233, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XII, 62331Q (4 May 2006); doi: 10.1117/12.666133
Published in SPIE Proceedings Vol. 6233:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XII
Sylvia S. Shen; Paul E. Lewis, Editor(s)
PDF: 13 pages
Proc. SPIE 6233, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XII, 62331Q (4 May 2006); doi: 10.1117/12.666133
Show Author Affiliations
David B. Cavanaugh, Surface Optics Corp. (United States)
Kenneth R. Castle, Ruda and Associates (United States)
Kenneth R. Castle, Ruda and Associates (United States)
Wayne Davenport, Aviation and Missile Research, Dev. and Engineering Ctr. (United States)
Published in SPIE Proceedings Vol. 6233:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XII
Sylvia S. Shen; Paul E. Lewis, Editor(s)
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