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Proceedings Paper

High-priority areas for army battle command (BC)-related modeling and simulation (M&S) science and technology (S&T)
Author(s): William S. Murphy Jr.; Joe Foreman; Dean S. Hartley III; Albert A. Sciarretta; Stuart H. Starr
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Paper Abstract

The Battle Command, Simulation, and Experimentation (BCSE) Directorate in the Army's Office of the Deputy Chief of Staff, G-3/5/7, has taken the initiative to identify high priority options for Battle Command (BC)-related modeling and simulation (M&S) science and technology (S&T). In an earlier paper, the methodology that was developed to identify those options was described (Ref 1). This paper summarizes the insights that were developed through the application of that methodology. It identifies and describes the high priority M&S S&T options in the following categories: modeling methodology, development methodology, computational capability, and data/information understanding. For each of the thirteen M&S S&T options in those categories, the activity is described, sources for identifying needs are cited, baseline activities are described, relationship among the M&S S&T areas are identified, and specific initiatives are proposed. The paper concludes by identifying alternative M&S S&T packages consistent with selected priority criteria. The results of this analysis will be used to convey investment priorities to the Deputy Assistant Secretary of the Army for Research & Technology.

Paper Details

Date Published: 22 May 2006
PDF: 13 pages
Proc. SPIE 6227, Enabling Technologies for Simulation Science X, 62270C (22 May 2006); doi: 10.1117/12.666079
Show Author Affiliations
William S. Murphy Jr., Alion Science and Technology (United States)
Joe Foreman, Dept. of the Army, BCSE Directorate (United States)
Dean S. Hartley III, Hartley Consulting (United States)
Albert A. Sciarretta, CNS Technologies, Inc. (United States)
Stuart H. Starr, Barcroft Research Institute (United States)

Published in SPIE Proceedings Vol. 6227:
Enabling Technologies for Simulation Science X
Dawn A. Trevisani, Editor(s)

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