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Proceedings Paper

Research and emulation of ranging in BPON system
Author(s): Guangxiang Yang; Dexin Tao; Yan He
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Paper Abstract

Ranging is one of the key technologies in Broadband Passive Optical Network based on the ATM (BPON) system. It is complex for software designers and difficult to test. In order to simplify the ranging procedure, enhance its efficiency, and find an appropriate method to verify it, a new ranging procedure that completely satisfies the requirements specified in ITU-T G.983.1 and one verifying method is proposed in this paper. A kind of ranging procedure without serial number (SN) searching function, called one-by-one ranging are developed under the condition of cold PON, cold Optical Network Termination (ONU). The ranging procedure includes the use of OLT and ONU flow charts respectively. By using the network emulation software OPNET, the BPON system is modeled and the ranging procedure is simulated. The emulation experimental results show that the presented ranging procedure can effectively eliminate the collision of burst mode signals between ONUs, which can be ranged one-by-one under the controlling of OLT, while also enhancing the ranging efficiency. As all of the message formats used in this research conform with the ITU-T G.983.1, the ranging procedure can meet the protocol specifications with good interoperability, and is very compatible with products of other manufacturer. According to the present study of ranging procedures, guidelines and principles are provided, Also some design difficulties are eliminated in the software design.

Paper Details

Date Published: 21 March 2006
PDF: 6 pages
Proc. SPIE 6040, ICMIT 2005: Mechatronics, MEMS, and Smart Materials, 60400O (21 March 2006); doi: 10.1117/12.664166
Show Author Affiliations
Guangxiang Yang, Wuhan Univ. of Technology (China)
Dexin Tao, Wuhan Univ. of Technology (China)
Yan He, FiberHome Telecommunication Technologies Co. Ltd. (China)

Published in SPIE Proceedings Vol. 6040:
ICMIT 2005: Mechatronics, MEMS, and Smart Materials
Yunlong Wei; Kil To Chong; Takayuki Takahashi; Shengping Liu; Zushu Li; Zhongwei Jiang; Jin Young Choi, Editor(s)

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