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Proceedings Paper

Characterization and comparison of 128x128 element nuclear optical dynamic display system resistive arrays
Author(s): Alexander G. Hayes; Fino J. Caraco; David C. Harrison; John M. Sorvari
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Paper Abstract

Dynamic infrared scene projection is a common technology used to provide end to end testing and characterization of infrared sensor systems. Scene projection technology will play an increasing role in infrared system evaluation and development as the cost and risk of flight testing increases and new display technologies begin to emerge. This paper describes a series of tests performed in the Seeker Experimental System (SES) at MIT Lincoln Laboratory (MIT LL). A small collection of 128×128 element Nuclear Optical Dynamic Display System (NODDS) resistive arrays were tested and compared using FIESTA drive electronics developed by ATK Mission Research. The residual spatial nonuniformity of the NODDS arrays were calculated after applying a sparse grid based nonuniformity correction algorithm developed at MIT LL. The nonuniformity correction algorithm is a slightly modified version of the industry standard sparse grid technique and is outlined in this paper. Additional metrics used to compare the arrays include emitter temporal response, raw nonuniformity, transfer function smoothness, dynamic range, and bad display pixel characteristics.

Paper Details

Date Published: 16 May 2006
PDF: 18 pages
Proc. SPIE 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI, 62080X (16 May 2006); doi: 10.1117/12.663802
Show Author Affiliations
Alexander G. Hayes, MIT Lincoln Lab. (United States)
Fino J. Caraco, MIT Lincoln Lab. (United States)
David C. Harrison, MIT Lincoln Lab. (United States)
John M. Sorvari, MIT Lincoln Lab. (United States)

Published in SPIE Proceedings Vol. 6208:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
Robert Lee Murrer Jr., Editor(s)

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