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Proceedings Paper

LCOS as a reference element in Twyman-Green laser interferometer
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Paper Abstract

Micro-Electro-Mechanical Systems are nowadays frequently used in many fields of industry. The number of their applications increases and their functions become more responsible, therefore precise knowledge about their properties is necessary. Due to its fragility and small sizes non-contact and high sensitive measurement method is required. Two-beam laser interferometry is one of the most popular testing methods of microelements. Such method implemented in Twyman-Green interferometer allows for full-field shape determination and out-of-plane displacement measurement. However the elements under test may bring additional challenges: their surfaces may have complicated shape or large shape gradients which prohibit their testing by means of interferometer with a flat reference mirror. To overcome such problems we propose to use LCOS (Liquid Crystal On Silicon) - phase, reflective SLM as an active reference element. LCOS serves as an adaptive reference mirror and phase shifter. The use of such element allows increasing measurement range of the interferometer and simplifies out-of-plane displacement measurement through object wavefront compensation. The applicability of the modified Twyman-Green interferometer will be shown at the examples of active micromembranes testing.

Paper Details

Date Published: 28 April 2006
PDF: 9 pages
Proc. SPIE 6188, Optical Micro- and Nanometrology in Microsystems Technology, 61881C (28 April 2006);
Show Author Affiliations
Jacek Kacperski, Warsaw Univ. of Technology (Poland)
Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland)
Michal Jozwik, Univ. de Franche-Comté (France)

Published in SPIE Proceedings Vol. 6188:
Optical Micro- and Nanometrology in Microsystems Technology
Christophe Gorecki; Anand K. Asundi; Wolfgang Osten, Editor(s)

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