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Proceedings Paper

Speckle-based metrology systems and linear canonical transform photography in mixed domains
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Paper Abstract

It has been shown that complex paraxial optical systems, consisting of various lens and distances of free space propagation, can be described using the Linear Canonical Transform (LCT). Indeed it can be shown that many well know optical transforms such as the Optical Fourier Transform (OFT), Optical Fractional Fourier Transform (OFRT), the effect of a lens or Chirp Modulation Transform (CMT) are all subsets of the more general LCT. Using the ABCD Collins matrix formula it is possible to represent these integral transforms in a simpler form, which facilitates system analysis and design. Speckle Photography (SP) in combination with an optical LCT can be used to measure surface motion of an optically rough body. It has previously been shown that Optical FRT's (OFRT) can be used in speckle based metrology systems to vary the range and sensitivity of a metrology system and also to determine both, the magnitude and direction, of tilting (rotation) and translation motion simultaneously, provided that the motion is captured in two separate OFRT domains. In this paper we extend the OFRT analysis to more general LCT systems and demonstrate how simultaneous tilt and translation measurements can be discerned from the speckle images captured prior to, and after motion. A spherical wavefront can be conveniently described using the Collin's matrix notation. By changing the wavefront of the illuminating light we show that we effectively change the domain of the LCT system without changing the bulk elements in the optical system. Thus the complete motion (in-plane translation and small surface tilting) of a rigid body can be determined using one optical LCT system and illuminating fields of varying curvature.

Paper Details

Date Published: 25 April 2006
PDF: 12 pages
Proc. SPIE 6187, Photon Management II, 61870W (25 April 2006); doi: 10.1117/12.663037
Show Author Affiliations
Jennifer E. Ward, Univ. College Dublin (Ireland)
Damien P. Kelly, Univ. College Dublin (Ireland)
Robert F. Patten, Univ. College Dublin (Ireland)
Bryan M. Hennelly, Univ. College Dublin (Ireland)
Ying Liu, Univ. College Dublin (Ireland)
John T. Sheridan, Univ. College Dublin (Ireland)

Published in SPIE Proceedings Vol. 6187:
Photon Management II
John T. Sheridan; Frank Wyrowski, Editor(s)

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