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Proceedings Paper

In-process 3D assessment of micromoulding features
Author(s): B. R. Whiteside; R. Spares; P. D. Coates
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Paper Abstract

Micro injection moulding (micromoulding) technology has recently emerged as a viable manufacturing route for polymer, metal and ceramic components with micro-scale features and surface textures. With a cycle time for production of a single component of just a few seconds, the proces offers the capability for mass production of microscale devices at a low marginal cost. However, the extreme stresses, strain rates and temperature gradients characteristic of the process have the consequence that a slight fluctuation in material properties or moulding conditions can have a significant impact on the dimensional or structural properties of the resulting component and in-line process monitoring is highly desirable. This paper describes the development of an in-process, high speed 3-dimensional measurement system for evaluation of every component manufactured during the process. A high speed camera and microscope lens coupled with a linear stage are used to create a stack of images which are subsequently processed using extended depth of field techniques to form a virtual 3-dimensional contour of the component. This data can then be used to visually verify the quality of the moulding on-screen or standard machine vision algorithms can be employed to allow fully automated quality inspection and filtering of sub-standard products. Good results have been obtained for a range of materials and geometries and measurement accuracy has been verified through comparison with data obtained using a Wyko NT1100 white light interferometer.

Paper Details

Date Published: 28 April 2006
PDF: 10 pages
Proc. SPIE 6188, Optical Micro- and Nanometrology in Microsystems Technology, 61880Z (28 April 2006); doi: 10.1117/12.662566
Show Author Affiliations
B. R. Whiteside, Univ. of Bradford (United Kingdom)
R. Spares, Univ. of Bradford (United Kingdom)
P. D. Coates, Univ. of Bradford (United Kingdom)

Published in SPIE Proceedings Vol. 6188:
Optical Micro- and Nanometrology in Microsystems Technology
Christophe Gorecki; Anand K. Asundi; Wolfgang Osten, Editor(s)

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