Share Email Print

Proceedings Paper

High performance 1.3μm InAs/GaAs quantum dot lasers with low threshold current and negative characteristic temperature
Author(s): H. Y. Liu; T. J. Badcock; K. M. Groom; M. Hopkinson; M. Gutiérrez; D. T. Childs; C. Jin; R. A. Hogg; I. R. Sellers; D. J. Mowbray; M. S. Skolnick; R. Beanland; D. J. Robbins
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A high-growth-temperature step used for the GaAs spacer layer is shown to significantly improve the performance of 1.3-μm multilayer InAs/GaAs quantum-dot (QD) lasers. The high-growth-temperature spacer layer inhibits threading dislocation formation, resulting in enhanced electrical and optical characteristics and hence improved laser performance. The combination of high-growth-temperature GaAs spacer layers and high-reflectivity (HR) coated facets has been utilized to further reduce the threshold current and threshold current density (Jth) for 1.3-μm InAs/GaAs QD lasers. Very low continuous-wave room-temperature threshold current of 1.5 mA and a threshold current density of 18.8 A/cm2 are achieved for a 3-layer device with a 1-mm long HR/HR cavity. For a 2-mm cavity the continuous-wave threshold current density is as low as 17 A/cm2 at room temperature for an HR/HR device. An output power as high as 100 mW is obtained for a device with HR/cleaved facets. The high-growth-temperature spacer layers have only a relatively small effect on the temperature stability of the threshold current above room temperature. To further increase the characteristic temperature (T0) of the QD lasers, 1.3-μm InAs/GaAs QD lasers incorporating p-type modulation doping have been grown and studied. A negative T0 and Jth of 48 A/cm-2 at room temperature have been obtained by combining the high-growth-temperature GaAs spacer layers with the p-type modulation doping of the QDs.

Paper Details

Date Published: 14 April 2006
PDF: 11 pages
Proc. SPIE 6184, Semiconductor Lasers and Laser Dynamics II, 618417 (14 April 2006); doi: 10.1117/12.662499
Show Author Affiliations
H. Y. Liu, Univ. of Sheffield (United Kingdom)
T. J. Badcock, Univ. of Sheffield (United Kingdom)
K. M. Groom, Univ. of Sheffield (United Kingdom)
M. Hopkinson, Univ. of Sheffield (United Kingdom)
M. Gutiérrez, Univ. of Sheffield (United Kingdom)
D. T. Childs, Bookham Technology plc (United Kingdom)
C. Jin, Univ. of Sheffield (United Kingdom)
R. A. Hogg, Univ. of Sheffield (United Kingdom)
I. R. Sellers, Univ. of Sheffield (United Kingdom)
D. J. Mowbray, Univ. of Sheffield (United Kingdom)
M. S. Skolnick, Univ. of Sheffield (United Kingdom)
R. Beanland, Bookham Technology plc (United Kingdom)
D. J. Robbins, Bookham Technology plc (United Kingdom)

Published in SPIE Proceedings Vol. 6184:
Semiconductor Lasers and Laser Dynamics II
Daan Lenstra; Markus Pessa; Ian H. White, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?