Share Email Print

Proceedings Paper

Development of an electro-optic step-by-step sampling system for IC's close electro-magnetic field measurement
Author(s): Lucio Rossi; G. Breglio; A. Irace; P. Spirito
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In this work we aim to realize a step-by-step electro-optical probe which exploits the linear (Pockels) electro-optic effect to survey the electromagnetic field on the surface of RF integrated circuits. This probe measures the variation of light polarization induced by a lithium niobate crystal immersed in the electric field provided by the DUT. The measurements will demonstrate the main features of this system which can be summarized in non-invasiveness, wide bandwidth, linearity and small spatial resolution. The LiNbO3 crystals have been developed by SELEX Sistemi Integrati S.p.A. Roma, and the whole research activity has been carried out under the sponsorship of the CRdC Nuove Tecnologie per le Attivita Produttive, the Campania Region Centre of Competence on New Technologies.

Paper Details

Date Published: 22 April 2006
PDF: 8 pages
Proc. SPIE 6189, Optical Sensing II, 61890F (22 April 2006); doi: 10.1117/12.662043
Show Author Affiliations
Lucio Rossi, Univ. degli Studi di Napoli Federico II (Italy)
G. Breglio, Univ. degli Studi di Napoli Federico II (Italy)
A. Irace, Univ. degli Studi di Napoli Federico II (Italy)
P. Spirito, Univ. degli Studi di Napoli Federico II (Italy)

Published in SPIE Proceedings Vol. 6189:
Optical Sensing II
Brian Culshaw; Anna G. Mignani; Hartmut Bartelt; Leszek R. Jaroszewicz, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?