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Proceedings Paper

Experimental demonstration of using nano-photonic crystal sensor systems for submicron damage detection, quantification, and diagnoses
Author(s): J. C. Verley; S. S. Mani; J. G. Fleming; I. El-Kady; T. Khraishi; M. M. Reda Taha
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Paper Abstract

Photonic crystals (PC) are artificially fabricated crystals with a periodicity in the dielectric function. The spectral signature of such crystals is intricately tied to their underlying crystal lattice structural parameters. A result of this is that significant spectral changes can occur if damage is induced in the photonic crystal. In this work we present preliminary experimental results that demonstrate the possible use of photonic crystals as sensors for the detection, quantification and diagnosis of sub-micron damage. The experimentally observed variation in the reflection spectra of the photonic crystals is related to the damage induced in the material. A novel damage metric, based on principles of fuzzy pattern recognition, is introduced and is used to identify and quantify micro-damage in the photonic crystal. The corresponding damage metric is also presented and discussed. The detailed fabrication steps, as well as the advantages and limitations of this new approach are also addressed. It is concluded that photonic crystals can be successfully used for micro-damage quantification.

Paper Details

Date Published: 16 March 2006
PDF: 8 pages
Proc. SPIE 6179, Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring II, 617904 (16 March 2006); doi: 10.1117/12.658676
Show Author Affiliations
J. C. Verley, Sandia National Labs. (United States)
S. S. Mani, Sandia National Labs. (United States)
J. G. Fleming, Sandia National Labs. (United States)
I. El-Kady, Sandia National Labs. (United States)
T. Khraishi, The Univ. of New Mexico (United States)
M. M. Reda Taha, Univ. of New Mexico (United States)

Published in SPIE Proceedings Vol. 6179:
Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring II
Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

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