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Proceedings Paper

An efficient detect model for crosstalk faults on SOC interconnects
Author(s): Jinlin Zhang; Chaoyang Chen; Xubang Shen
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Paper Abstract

As System-on-Chip (SOC) manufacture technology moves into ultra deep sub-micron (DSM) ear, Crosstalk faults between SoC interconnect result in improper function of the chip. This problem is becoming more and more severe. Based on the in-depth research of the property of crosstalk fault and the MAF model, we presented a simple and efficient model: the Search-Based Maximal Aggressor Fault (SB-MAF) for detecting glitch and delay faults caused by crosstalk effects on interconnects between components of a SOC. The respective efficiency of the presented model and the MAF model is given in the paper. The results of simulation show that two models' efficiency is comparable when crosstalk is weak. However, the efficiency of the SB-MAF model is obviously improved compare to the MAF model when there are strong crosstalk effects between SoC interconnects.

Paper Details

Date Published: 3 November 2005
PDF: 11 pages
Proc. SPIE 6043, MIPPR 2005: SAR and Multispectral Image Processing, 60432L (3 November 2005); doi: 10.1117/12.655019
Show Author Affiliations
Jinlin Zhang, HuaZhong Univ. of Science and Technology (China)
Chaoyang Chen, HuaZhong Univ. of Science and Technology (China)
Xubang Shen, HuaZhong Univ. of Science and Technology (China)
Xi'an Microelectronic Technology Institute (China)

Published in SPIE Proceedings Vol. 6043:
MIPPR 2005: SAR and Multispectral Image Processing
Liangpei Zhang; Jianqing Zhang; Mingsheng Liao, Editor(s)

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