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Proceedings Paper

Non-destructive micro-patterning of protein crystals by focused femtosecond laser
Author(s): Y. Hosokawa; T. Kaji; Y. Hiraki; H. Mori; H. Masuhara
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Paper Abstract

Micro-patterning of proteins has been attracted much attention as a potential technique to realize bio-microdevice. In this work, as a new method to realize non-destructive micro-patterning of proteins, laser transfer printing for a um-sized protein crystal was developed by utilizing focused femtosecond laser. The micro-patterning was performed to transfer the protein crystal which was adhered on a source substrate to a target substrate which was underlaid on the source substrate. An 800-nm femtosecond laser was focused in a water between the source and target substrates on an inverted microscope with a 100x objective lens. When the laser focal point was scanned at the position with distance of a few um far from the source substrate, the protein crystals were detached by a shockwave and cavitation bubble generation at the circumstance of the focal point and transferred to the target substrate forming a line pattern. The line width of the protein crystal was a few tens um with the scanning speed of 90 μm/sec. Furthermore, multi-patterning of several kinds of protein crystals was realized by this method. The pattering resolution is comparable or better than that by another multi-material transfer printing, such as ink jet printing, micro-printing, and laser direct writing.

Paper Details

Date Published: 28 February 2006
PDF: 9 pages
Proc. SPIE 6108, Commercial and Biomedical Applications of Ultrafast Lasers VI, 610805 (28 February 2006); doi: 10.1117/12.654706
Show Author Affiliations
Y. Hosokawa, Osaka Univ. (Japan)
T. Kaji, Osaka Univ. (Japan)
Y. Hiraki, Kyoto Univ. (Japan)
H. Mori, Kyoto Institute of Technology (Japan)
Protein Crystal Corp. (Japan)
H. Masuhara, Osaka Univ. (Japan)

Published in SPIE Proceedings Vol. 6108:
Commercial and Biomedical Applications of Ultrafast Lasers VI
Joseph Neev; Stefan Nolte; Alexander Heisterkamp; Christopher B. Schaffer, Editor(s)

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