Share Email Print

Proceedings Paper

Energy-dependent scintillation intensity of fluorozirconate-based glass-ceramic x-ray detectors
Author(s): Stefan Schweizer; Bastian Henke; Stephanie Köneke; Jacqueline A. Johnson; Gang Chen; John Woodford
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We investigated the energy-dependent scintillation intensity of Eu-doped fluorozirconate glass-ceramic x-ray detectors in the energy range from 6 to 20 keV. The experiments were performed at the Advanced Photon Source, Argonne National Laboratory. The glass ceramics are based on Eu-doped fluorozirconate glasses, which were additionally doped with chlorine to initiate the nucleation of BaCl2 nanocrystals therein. The x-ray excited scintillation is mainly due to the 5d-4f transition of Eu2+ embedded in the BaCl2 nanocrystals; Eu2+ in the glass does not luminesce. Upon appropriate annealing the nanocrystals grow and undergo a phase transition from a hexagonal to an orthorhombic phase of BaCl2. The scintillation intensity is investigated as a function of the x-ray energy as well as of the particle size and structure of the embedded nanoparticles. The scintillation intensity versus x-ray energy dependence shows that the intensity is inversely proportional to the photoelectric absorption of the material, i.e. the more photoelectric absorption the less scintillation.

Paper Details

Date Published: 2 March 2006
PDF: 7 pages
Proc. SPIE 6142, Medical Imaging 2006: Physics of Medical Imaging, 61422Y (2 March 2006); doi: 10.1117/12.653769
Show Author Affiliations
Stefan Schweizer, Argonne National Lab. (United States)
Univ. of Paderborn (Germany)
Bastian Henke, Univ. of Paderborn (Germany)
Stephanie Köneke, Univ. of Paderborn (Germany)
Jacqueline A. Johnson, Argonne National Lab. (United States)
Gang Chen, Argonne National Lab. (United States)
John Woodford, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 6142:
Medical Imaging 2006: Physics of Medical Imaging
Michael J. Flynn; Jiang Hsieh, Editor(s)

© SPIE. Terms of Use
Back to Top