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Proceedings Paper

Novel features of the x-ray scatter profile that are not modeled by convolution of the primary
Author(s): J. Eric Tkaczyk; Yves Trousset; Deborah Walter; Yanfeng Du; Richard A. Thompson; Daniel Harrison
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Paper Abstract

A convolution model of scatter that is adaptable to rapid simulation and correction algorithms is tested against the measured scatter profiles. In the simple case of a uniform acrylic sheet, the convolution approach yields about 10% absolute agreement with the measured scatter profile. However, significant qualitative differences are demonstrated for phantoms with non-uniform thickness or composition. For example, the scatter profile is dependent on a bone's vertical position in the phantom whereas the primary is unchanged. Similarly, a cusp shape in the scatter profile observed near the abrupt edge of an acrylic sheet is not produced in the convolution model. An alternate approach that calculates the scatter as a 3D integral over the object volume can reproduce this behavior.

Paper Details

Date Published: 3 March 2006
PDF: 12 pages
Proc. SPIE 6142, Medical Imaging 2006: Physics of Medical Imaging, 614232 (3 March 2006); doi: 10.1117/12.653747
Show Author Affiliations
J. Eric Tkaczyk, General Electric Research (United States)
Yves Trousset, General Electric Healthcare (France)
Deborah Walter, General Electric Research (United States)
Yanfeng Du, General Electric Research (United States)
Richard A. Thompson, General Electric Research (United States)
Daniel Harrison, General Electric Research (United States)

Published in SPIE Proceedings Vol. 6142:
Medical Imaging 2006: Physics of Medical Imaging
Michael J. Flynn; Jiang Hsieh, Editor(s)

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