Share Email Print

Proceedings Paper

Fast and high-accurate 3D registration algorithm using hierarchical M-ICP
Author(s): Haruhisa Okuda; Yasuo Kitaaki; Manabu Hashimoto; Shun'ichi Kaneko
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This paper presents a novel fast and high-accurate 3-D registration algorithm. The ICP (Iterative Closest Point) algorithm converges all the 3-D data points of two data sets to the best matching points with minimum evaluation values. This algorithm is broadly used, because it has good availability to many applications. But, it needs many computational costs and it is very sensible to error values. Because, it uses whole data points of two data sets and least mean square optimization. We had proposed the M-ICP algorithm, which is an extension of the ICP algorithm based on modified M-estimation for realization of robustness against outlying gross noise. The proposed algorithm named HM-ICP (Hierarchical M-ICP) is an extension of the M-ICP with selecting region for matching and hierarchical searching of selected regions. In this algorithm, we select regions using evaluation of variance for distance values in the target region and homogeneous topological mapping. Some fundamental experiments utilizing real data sets of 3-D measurement show effectiveness of the proposed method. We achieved more than 4-digits number reduction of computational costs and confirmed less than 0.1% error to the measurement distance.

Paper Details

Date Published: 6 December 2005
PDF: 8 pages
Proc. SPIE 6051, Optomechatronic Machine Vision, 60510N (6 December 2005); doi: 10.1117/12.648811
Show Author Affiliations
Haruhisa Okuda, Mitsubishi Electric Corp. (Japan)
Yasuo Kitaaki, Mitsubishi Electric Corp. (Japan)
Manabu Hashimoto, Mitsubishi Electric Corp. (Japan)
Shun'ichi Kaneko, Hokkaido Univ. (Japan)

Published in SPIE Proceedings Vol. 6051:
Optomechatronic Machine Vision
Kazuhiko Sumi, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?