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Proceedings Paper

Bending of aluminum alloy beams depending on irradiance and repetition rate of UV laser radiation
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Paper Abstract

Aluminum alloy beams having the same width but different lengths were made with semiconductor fabrication methods at the IPMS. The beams are clamped on one end with posts to the underlying plane. They are illuminated with 248 nm UV radiation created by an excimer laser and the bending was investigated in dependence on energy density and repetition rate. This behaviour is important for the development and the operation of MOEMS structures when used in UV applications. Ultraviolet radiation is used for lithography as well as material processing. The light-material interaction is well investigated for high energy densities (Ed) which are used for drilling holes or ablation of materials. In this work the influence of 248 nm low energy pulses (Ed < 200 μJ/cm2) on thin beams of aluminum alloys having a thickness of several hundreds of nanometer is analyzed. The frequency of the laser radiation is varied from 1000 to 2000 Hz. The beams have different lengths and are clamped on one end. Before illumination the beams are planar, after illumination the beams show a curvature which is related to internal stresses. The amount of curvature is dependent on the geometry of the beam, the energy density and the repetition rate of the radiation pulses. Also the relaxation behaviour of the curved beam is examined, i. e. the curvature change after the end of irradiation. The results will help to predict the practicability of materials for MOEMS in UV applications (mirror structures) and to understand their behaviour.

Paper Details

Date Published: 5 January 2006
PDF: 8 pages
Proc. SPIE 6111, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V, 611109 (5 January 2006); doi: 10.1117/12.647358
Show Author Affiliations
Mathias Krellmann, Fraunhofer Institute for Photonic Microsystems (Germany)
Martin Friedrichs, Fraunhofer Institute for Photonic Microsystems (Germany)
Ulrike Dauderstädt, Fraunhofer Institute for Photonic Microsystems (Germany)
Michael Wagner, Fraunhofer Institute for Photonic Microsystems (Germany)
Hubert Lakner, Fraunhofer Institute for Photonic Microsystems (Germany)


Published in SPIE Proceedings Vol. 6111:
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
Danelle M. Tanner; Rajeshuni Ramesham, Editor(s)

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