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Proceedings Paper

Numerical analysis of forces in optical tweezers in the Rayleigh regime
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Paper Abstract

In this work we present a numerical evaluation of the forces in an optical tweezers system, for metallic nanoparticles in the Rayleigh regime. Initially a Gaussian beam is described in the scalar approximation, and the forces it can apply on Rayleigh dielectric and metallic particles are computed within the point-dipole approach. The method is then extended to dielectric and metallic Rayleigh particles in a Laguerre-Gaussian beam, i.e. a higher order beam that is increasingly used for optical trapping experiments. We discuss the limits of the approximation for the beam intensity by comparing the numerical results with the experimental measurements that can be found in literature.

Paper Details

Date Published: 14 December 2005
PDF: 8 pages
Proc. SPIE 5972, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II, 597205 (14 December 2005); doi: 10.1117/12.639430
Show Author Affiliations
V. Garbin, TASC-INFM (Italy)
Univ. of Trieste (Italy)
D. Cojoc, TASC-INFM (Italy)
Politehnica Univ. of Bucharest (Romania)
R. Kulkarni, International Institute of Information Technology (India)
R. Malureanu, TASC-INFM (Italy)
Lecce Univ. (Italy)
E. Ferrari, TASC-INFM (Italy)
Univ. of Trieste (Italy)
M. Nadasan, Politehnica Univ. of Bucharest (Romania)
E. Di Fabrizio, TASC-INFM (Italy)

Published in SPIE Proceedings Vol. 5972:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II
Ovidiu Iancu; Adrian Manea; Paul Schiopu; Dan Cojoc, Editor(s)

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