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Proceedings Paper

Clean assembly practices to prevent contamination and damage to optics
Author(s): James A. Pryatel; William H. Gourdin
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Paper Abstract

A key lesson learned from the earliest optics installed in the National Ignition Facility (NIF) was that the traditional approach for maintaining cleanliness, such as the use of cleanrooms and associated garments and protocols, is inadequate. Assembly activities often negate the benefits provided by cleanrooms, and in fact generate contamination with high damage potential. As a result, NIF introduced "clean assembly protocols" and related practices to supplement the traditional clean room protocols. These new protocols included "clean-as-you-go" activities and regular bright light inspections. Introduction of these new protocols has greatly reduced the particle contamination found on more recently installed optics. In this paper we will describe the contamination mechanisms we have observed and the details of the clean assembly protocols we have successfully introduced to mitigate them.

Paper Details

Date Published: 7 February 2006
PDF: 9 pages
Proc. SPIE 5991, Laser-Induced Damage in Optical Materials: 2005, 59910Q (7 February 2006); doi: 10.1117/12.638930
Show Author Affiliations
James A. Pryatel, LRL Energy Services (United States)
William H. Gourdin, Lawrence Livermore National Lab. (United States)

Published in SPIE Proceedings Vol. 5991:
Laser-Induced Damage in Optical Materials: 2005
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M.J. Soileau; Christopher J. Stolz, Editor(s)

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