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Proceedings Paper

Laser damage initiation and growth of antireflection coated S-FAP crystal surfaces prepared by pitch lap and magnetorheological finishing
Author(s): Christopher J. Stolz; Joseph A. Menapace; Kathleen I. Schaffers; Camille Bibeau; Michael D. Thomas; Andrew J. Griffin
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Paper Abstract

Antireflection (AR) coatings typically damage at the interface between the substrate and coating. Therefore the substrate finishing technology can have an impact on the laser resistance of the coating. For this study, AR coatings were deposited on Yb:S-FAP [Yb3+:Sr5(PO4)3F] crystals that received a final polish by both conventional pitch lap finishing as well as magnetorheological finishing (MRF). SEM images of the damage morphology reveals laser damage originates at scratches and at substrate coating interfacial absorbing defects. Previous damage stability tests on multilayer mirror coatings and bare surfaces revealed damage growth can occur at fluences below the initiation fluence. The results from this study suggest the opposite trend for AR coatings. Investigation of unstable HR and uncoated surface damage morphologies reveals significant radial cracking that is not apparent with AR damage due to AR delamination from the coated surface with few apparent cracks at the damage boundary. Damage stability tests show that coated Yb:S-FAP crystals can operate at 1057 nm at fluences around 20 J/cm2 at 10 ns; almost twice the initiation damage threshold.

Paper Details

Date Published: 7 February 2006
PDF: 7 pages
Proc. SPIE 5991, Laser-Induced Damage in Optical Materials: 2005, 59911I (7 February 2006); doi: 10.1117/12.638831
Show Author Affiliations
Christopher J. Stolz, Lawrence Livermore National Lab. (United States)
Joseph A. Menapace, Lawrence Livermore National Lab. (United States)
Kathleen I. Schaffers, Lawrence Livermore National Lab. (United States)
Camille Bibeau, Lawrence Livermore National Lab. (United States)
Michael D. Thomas, Spica Technologies, Inc. (United States)
Andrew J. Griffin, Spica Technologies, Inc. (United States)

Published in SPIE Proceedings Vol. 5991:
Laser-Induced Damage in Optical Materials: 2005
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M.J. Soileau; Christopher J. Stolz, Editor(s)

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