Proceedings Paper
Scattering in THz imaging| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
A new mathematical method, the Phase Distribution Model, is devised for the calculation of attenuation and scattering of THz radiation in random materials. The accuracy of the approximation is tested by comparison with exact calculations and with experimental measurements on textiles and specially constructed phantoms.
Paper Details
Date Published: 4 November 2005
PDF: 6 pages
Proc. SPIE 5989, Technologies for Optical Countermeasures II; Femtosecond Phenomena II; and Passive Millimetre-Wave and Terahertz Imaging II, 598912 (4 November 2005); doi: 10.1117/12.638007
Published in SPIE Proceedings Vol. 5989:
Technologies for Optical Countermeasures II; Femtosecond Phenomena II; and Passive Millimetre-Wave and Terahertz Imaging II
Sean M. Kirkpatrick; David H. Titterton; Roger Appleby; J. Martyn Chamberlain; Razvan Stoian; Keith A. Krapels, Editor(s)
PDF: 6 pages
Proc. SPIE 5989, Technologies for Optical Countermeasures II; Femtosecond Phenomena II; and Passive Millimetre-Wave and Terahertz Imaging II, 598912 (4 November 2005); doi: 10.1117/12.638007
Show Author Affiliations
J. R. Fletcher, Univ. of Durham (United Kingdom)
G. P. Swift, Univ. of Durham (United Kingdom)
De Chang Dai, Univ. of Durham (United Kingdom)
D. Beggs, Univ. of Durham (United Kingdom)
R. A. Abram, Univ. of Durham (United Kingdom)
G. P. Swift, Univ. of Durham (United Kingdom)
De Chang Dai, Univ. of Durham (United Kingdom)
D. Beggs, Univ. of Durham (United Kingdom)
R. A. Abram, Univ. of Durham (United Kingdom)
M. Kaliteevski, Univ. of Durham (United Kingdom)
J. Levitt, Univ. of Durham (United Kingdom)
A. Gallant, Univ. of Durham (United Kingdom)
J. M. Chamberlain, Univ. of Durham (United Kingdom)
J. Levitt, Univ. of Durham (United Kingdom)
A. Gallant, Univ. of Durham (United Kingdom)
J. M. Chamberlain, Univ. of Durham (United Kingdom)
Published in SPIE Proceedings Vol. 5989:
Technologies for Optical Countermeasures II; Femtosecond Phenomena II; and Passive Millimetre-Wave and Terahertz Imaging II
Sean M. Kirkpatrick; David H. Titterton; Roger Appleby; J. Martyn Chamberlain; Razvan Stoian; Keith A. Krapels, Editor(s)
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