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Proceedings Paper

A new method for evaluating semiconductor laser beam quality
Author(s): Changqing Cao; Xiaodong Zeng; Yuying An; Qiang Xu; Zhejun Feng
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Paper Abstract

Beam quality is very important in laser technology and its application. In practice a good beam quality evaluating method can indicate which beam is good and which laser is suitable. Therefore evaluating beam quality is of huge significance. Because the beam of laser diode has many characteristics differ from other lasers, such as the angle of the beam is too big, and the angle in the direction parallel to the junction plane disagrees with it in the perpendicular direction, a new quality parameter Q(θ,ω,d) for evaluating beam quality of laser diode is given. The difficulty of collimation is well expressed by use of Q. The smaller the value of Q is, the more easily the beam is collimated.

Paper Details

Date Published: 2 December 2005
PDF: 4 pages
Proc. SPIE 6020, Optoelectronic Materials and Devices for Optical Communications, 60202H (2 December 2005); doi: 10.1117/12.633628
Show Author Affiliations
Changqing Cao, Xidian Univ. (China)
Xiaodong Zeng, Xidian Univ. (China)
Yuying An, Xidian Univ. (China)
Qiang Xu, Xidian Univ. (China)
Zhejun Feng, Xidian Univ. (China)

Published in SPIE Proceedings Vol. 6020:
Optoelectronic Materials and Devices for Optical Communications
Shinji Tsuji; Jens Buus; Yi Luo, Editor(s)

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