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Proceedings Paper

Identifying unknown nanocrystals by fringe fingerprinting in two dimensions and free-access crystallographic databases
Author(s): Peter Moeck; Ondřej Čertik; Bjoern Seipel; Rebecca Groebner; Lori Noice; Girish Upreti; Philip Fraundorf; Rolf Erni; Nigel D. Browning; Andreas Kiesow; Jean-Pierre Jolivet
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Paper Abstract

New needs to determine the crystallography of nanocrystals arise with the advent of science and engineering on the nanometer scale. Direct space high-resolution phase-contrast transmission electron microscopy (HRTEM) and atomic resolution Z-contrast scanning TEM (Z-STEM), when combined with tools for image-based nanocrystallography possess the capacity to meet these needs. This paper introduces such a tool, i.e. fringe fingerprinting in two dimensions (2D), for the identification of unknown nanocrystal phases and compares this method briefly to qualitative standard powder X-ray diffractometry (i.e. spatial frequency fingerprinting). Free-access crystallographic databases are also discussed because the whole fingerprinting concept is only viable if there are comprehensive databases to support the identification of an unknown nanocrystal phase. This discussion provides the rationale for our ongoing development of a dedicated free-access Nano-Crystallography Database (NCD) that contains comprehensive information on both nanocrystal structures and morphologies. The current status of the NCD project and plans for its future developments are briefly outlined. Although feasible in contemporary HRTEMs and Z-STEMs, fringe fingerprinting in 2D (and image-based nanocrystallography in general) will become much more viable with the increased availability of aberration-corrected transmission electron microscopes. When the image acquisition and interpretation are, in addition, automated in such microscopes, fringe fingerprinting in 2D will be able to compete with powder X-ray diffraction for the identification of unknown nanocrystal phases on a routine basis. Since it possesses a range of advantages over powder X-ray diffractometry, e.g., fringe fingerprint plots contain much more information for the identification of an unknown crystal phase, fringe fingerprinting in 2D may then capture a significant part of the nanocrystal metrology market.

Paper Details

Date Published: 7 November 2005
PDF: 12 pages
Proc. SPIE 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III, 60000M (7 November 2005); doi: 10.1117/12.629818
Show Author Affiliations
Peter Moeck, Portland State Univ. (United States)
Ondřej Čertik, Portland State Univ. (United States)
Charles University of Prague (Czech Republic)
Bjoern Seipel, Portland State Univ. (United States)
Rebecca Groebner, Portland State Univ. (United States)
Lori Noice, Portland State Univ. (United States)
Girish Upreti, Portland State Univ. (United States)
Philip Fraundorf, Univ. of Missouri at St. Louis (United States)
Rolf Erni, Univ. of California at Davis (United States)
Nigel D. Browning, Univ. of California at Davis (United States)
Lawrence Berkeley National Lab. (United States)
Andreas Kiesow, Fraunhofer Institute for Mechanics of Materials (Germany)
Jean-Pierre Jolivet, Univ. Pierre and Marie Curie (France)

Published in SPIE Proceedings Vol. 6000:
Two- and Three-Dimensional Methods for Inspection and Metrology III
Kevin G. Harding, Editor(s)

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