
Proceedings Paper
HgCdTe epitaxial layer cold optical filterFormat | Member Price | Non-Member Price |
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Paper Abstract
The optical filter for 8-12 microns spectral range on the base of MCT epilayer grown by Metal Organic Chemical Vapor Deposition (MOCVD) has been investigated. The CdTe mole fraction in CdxHg1-xTe equals x=0.24. The single-layer antireflection coatings for 10 μm peak wavelength have been deposed on the both sides of the filter. Transmission in 8-12 μm spectral range exceeds 70%. Transmission at 7 μm is of 40%, at 6 μm-10%, at 5 μm-less than 2%.
Paper Details
Date Published: 7 June 2005
PDF: 3 pages
Proc. SPIE 5834, 18th International Conference on Photoelectronics and Night Vision Devices, (7 June 2005); doi: 10.1117/12.629008
Published in SPIE Proceedings Vol. 5834:
18th International Conference on Photoelectronics and Night Vision Devices
Anatoly M. Filachov; Vladimir P. Ponomarenko; Alexander I. Dirochka, Editor(s)
PDF: 3 pages
Proc. SPIE 5834, 18th International Conference on Photoelectronics and Night Vision Devices, (7 June 2005); doi: 10.1117/12.629008
Show Author Affiliations
K. O. Boltar, RD&P Ctr. ORION (Russia)
N. I. Iakovleva, RD&P Ctr. ORION (Russia)
I. D. Bourlakov, RD&P Ctr. ORION (Russia)
V. I. Stafeev, RD&P Ctr. ORION (Russia)
M. V. Sednev, RD&P Ctr. ORION (Russia)
N. I. Iakovleva, RD&P Ctr. ORION (Russia)
I. D. Bourlakov, RD&P Ctr. ORION (Russia)
V. I. Stafeev, RD&P Ctr. ORION (Russia)
M. V. Sednev, RD&P Ctr. ORION (Russia)
E. V. Permikina, RD&P Ctr. ORION (Russia)
A. N. Moiseev, Chemistry Institute of Rare Materials (Russia)
A. P. Kotkov, Chemistry Institute of Rare Materials (Russia)
N. D. Grishnova, Chemistry Institute of Rare Materials (Russia)
A. N. Moiseev, Chemistry Institute of Rare Materials (Russia)
A. P. Kotkov, Chemistry Institute of Rare Materials (Russia)
N. D. Grishnova, Chemistry Institute of Rare Materials (Russia)
Published in SPIE Proceedings Vol. 5834:
18th International Conference on Photoelectronics and Night Vision Devices
Anatoly M. Filachov; Vladimir P. Ponomarenko; Alexander I. Dirochka, Editor(s)
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