
Proceedings Paper
Linking fluorescence spectroscopy to the scale of spectral sensitivity: the BAM reference fluorometerFormat | Member Price | Non-Member Price |
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Paper Abstract
Providing fluorescence and fluorescence excitation spectra traceable
to the scale of spectral sensitivity (responsivity) and spectral
radiance at minimized uncertainty is currently limited by two
factors: The uncertainty of the available transfer standards and the
uncertainty of the measurement process itself. Here the
requirements on a reference fluorometer enabling measurements at
minimized uncertainty, its design, the simulation and the
realization are presented. The fluorometer is designed with
minimized chromatic and geometrical aberrations. To realize an
efficient reduction of stray light and subtractive dispersion a
double monochromator design was necessary. The basic element is a
so-called U-type Czerny-Turner single monochromator featuring
off-axis parabolas and an entrance and exit slit virtually at the
same place. Thereby spherical aberration, coma and astigmatism are
effectively minimized. The here employed special double
monochromator design further cancels the remaining aberrations of
the single monochromator. The design of the whole spectrometer was
optimized with a ray tracing program. To minimize uncertainties due
to the transfer standards, the reference fluorometer is exclusively
traceable to the spectral sensitivity (responsivity) scale. This
enables the use of transfer standards with much smaller uncertainty.
Here trap detectors are employed of common design but specially
calibrated for a divergent light bundle. Based on this instrument
with its achromatic design and precisely known numerical apertures
the determination of absolute fluorescence spectra will be
addressed.
Paper Details
Date Published: 18 August 2005
PDF: 10 pages
Proc. SPIE 5880, Optical Diagnostics, 588019 (18 August 2005); doi: 10.1117/12.628912
Published in SPIE Proceedings Vol. 5880:
Optical Diagnostics
Leonard M. Hanssen; Patrick V. Farrell, Editor(s)
PDF: 10 pages
Proc. SPIE 5880, Optical Diagnostics, 588019 (18 August 2005); doi: 10.1117/12.628912
Show Author Affiliations
Christian Monte, Federal Institute for Materials Research and Testing (Germany)
Walter Pilz, Federal Institute for Materials Research and Testing (Germany)
Walter Pilz, Federal Institute for Materials Research and Testing (Germany)
Ute Resch-Genger, Federal Institute for Materials Research and Testing (Germany)
Published in SPIE Proceedings Vol. 5880:
Optical Diagnostics
Leonard M. Hanssen; Patrick V. Farrell, Editor(s)
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