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Proceedings Paper

More-dimensional surface-relief gratings in films of azo dyes
Author(s): R. Meinhardt; S. Verpoort; A. Draude; D. Peyrot; H. Franke; R. A. Lessard
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Paper Abstract

Evaporated films of the azo-material DR 1 have been investigated. In the as-grown state partly crystalline films with low transmittance are obtained. Using homogeneous exposure transparent regions may be formed. The recording of holographic gratings in thin films (< 1 μm) of the azo dye is investigated for the case of more-dimensional light-intensity patterns. The mechanism of the photo-isomerisation of the azo-compounds is used to form dual gratings with a refractive index grating and a surface-relief grating. The grating-formation is investigated in case of 1D-gratings first. The time dependent diffraction efficiency is discussed in a model of 2 processes with different time-constants. A material transport process is involved in the formation of relief patterns. The enhancement of the modulation-depth of the surface-relief gratings is investigated for the application of a Corona discharge and a thermal treatment after the holographic recording. 2D-gratings are formed using either a 3-beam holographic set-up or a consecutive method. The resulting light patterns are simulated. Diffraction patterns and AFM-measurements are used to confirm these simulated structures. The modulation of the surface-relief gratings can be enhanced by thermal treatment after the holographic recording.

Paper Details

Date Published: 12 October 2005
PDF: 11 pages
Proc. SPIE 5970, Photonic Applications in Devices and Communication Systems, 59700N (12 October 2005); doi: 10.1117/12.628129
Show Author Affiliations
R. Meinhardt, Univ. of Duisburg-Essen (Germany)
S. Verpoort, Univ. of Duisburg-Essen (Germany)
A. Draude, Univ. of Duisburg-Essen (Germany)
D. Peyrot, COPL, Univ. Laval (Canada)
H. Franke, Univ. of Duisburg-Essen (Germany)
R. A. Lessard, COPL, Univ. Laval (Canada)

Published in SPIE Proceedings Vol. 5970:
Photonic Applications in Devices and Communication Systems
Peter Mascher; John C. Cartledge; Andrew Peter Knights; David V. Plant, Editor(s)

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