Share Email Print

Proceedings Paper

Fourier Transform estimation of reflecting thin film thickness
Author(s): Pierre G. Verly
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A parallel was recently established between an empirical procedure for the estimation of reflecting thin film thickness and new results derived from a Fourier Transform (FT) thin film synthesis technique. For simplicity the proposed FT approach was limited to a particular case. The approach is generalized in the present work and practical considerations are discussed. It is shown that good results are possible although the generalized problem is more complex from the FT point of view.

Paper Details

Date Published: 4 October 2005
PDF: 7 pages
Proc. SPIE 5963, Advances in Optical Thin Films II, 596306 (4 October 2005); doi: 10.1117/12.626713
Show Author Affiliations
Pierre G. Verly, National Research Council Canada (Canada)

Published in SPIE Proceedings Vol. 5963:
Advances in Optical Thin Films II
Claude Amra; Norbert Kaiser; H. Angus Macleod, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?