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Proceedings Paper

μ-PIXE and X-PIXE for radiological forensics
Author(s): Paula Provencio; Barney Doyle; Arlyn Antolak; Daniel Morse; Charles Richardson
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Paper Abstract

Sandia is evaluating methods for identifying and quantifying trace signatures in field collection samples to support national deterrence policies. The first step in this process is to identify which combination of major, minor, and trace elements in a recovered collection sample provides the most reliable forensic information, and then to be able to quickly, accurately, and, in some cases, nondestructively measure these components. Conventional approaches have typically required a long, complex series of sample preparations followed by radiochemical analysis, often yielding only qualitative results. We report on our investigations to assess accelerator-based ion beam analysis methods by cross-calibrating with other methods, performing in-air analyses of bagged samples in anticipation of inspecting poorly constituted radioactive materials, and quantifying the uncertainties for detected elements.

Paper Details

Date Published: 14 September 2005
PDF: 6 pages
Proc. SPIE 5923, Penetrating Radiation Systems and Applications VII, 592304 (14 September 2005);
Show Author Affiliations
Paula Provencio, Sandia National Labs. (United States)
Barney Doyle, Sandia National Labs. (United States)
Arlyn Antolak, Sandia National Labs. (United States)
Daniel Morse, Sandia National Labs. (United States)
Charles Richardson, Sandia National Labs. (United States)

Published in SPIE Proceedings Vol. 5923:
Penetrating Radiation Systems and Applications VII
F. Patrick Doty; H. Bradford Barber; Hans Roehrig, Editor(s)

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