Share Email Print
cover

Proceedings Paper

Azimuthal ellipsometry of subsurface layer stresses of specular metallic ribbons
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Having determined the deviations of ellipsometrical parameters for light reflected from the ribbon surface as a function of its orientation in the ribbon plane, the level of internal strain changes in the subsurface layer of Fe-based (Fe75Ni4Mo3Si2B16 and Fe70Cr15B15 ) amorphous metal alloys has been analyzed. Optical measurements were carried out for as-casted ribbons at 12 (Fe75Ni4Mo3Si2B16) and 4 (Fe70Cr15B15 ) orientations of the ribbon longitudinal axis relatively to the plane of light incidence. For each orientation phase shift Δ between p- and s-components of the polarization vector and an azimuth Ψ of the restored linear polarization have been obtained using a LEF-3M reflectometer-goniometer. From the angular dependence Δ(φ) (φ is angle of light incidence), the principal angle φ0 of light incidence was determined. Then, by rotating the sample around a normal to its surface within 360°, the polar diagrams (so-called indicatrices of ellipsometric parameters on rotation azimuth α) have been determined. The noncircular form of the polar diagram indicates a high sensitivity to internal stress variations arising during ribbon preparation. For Fe70Cr15B15 ribbons the long-time irradiation even by comparatively small fluencies of neutrons, causes structural relaxation and essentially influences on optical properties in the IR. It was determined that in the IR a real part of the complex dielectric function ε1>0 at any values φ angle of light incidence and α (azimuthal orientation of the ribbon longitudinal axis with respect to the light incidence plane).

Paper Details

Date Published: 19 October 2005
PDF: 7 pages
Proc. SPIE 5965, Optical Fabrication, Testing, and Metrology II, 59651T (19 October 2005); doi: 10.1117/12.625137
Show Author Affiliations
L. V. Poperenko, Taras Shevchenko National Kyiv Univ. (Ukraine)
M. V. Ozerov, Taras Shevchenko National Kyiv Univ. (Ukraine)


Published in SPIE Proceedings Vol. 5965:
Optical Fabrication, Testing, and Metrology II
Angela Duparré; Roland Geyl; Lingli Wang, Editor(s)

© SPIE. Terms of Use
Back to Top