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Proceedings Paper

Wavefront measurement of space infrared telescopes at cryogenic temperature
Author(s): Hidehiro Kaneda; Takashi Onaka; Takao Nakagawa; Keigo Enya; Hiroshi Murakami; Ryoji Yamashiro; Tatsuhiko Ezaki; Yasuyuki Numao; Yoshikazu Sugiyama
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Paper Abstract

In this paper, we describe our recent activities on wave-front measurement of space infrared telescopes. Optical performance of the 685-mm lightweight telescope on board the Japanese infrared astronomical satellite, ASTRO-F, has been evaluated at cryogenic temperatures. The mirrors of the ASTRO-F telescope are made of sandwich-type silicon carbide (SiC) material, comprising porous core and CVD coat of SiC on the surface. The total wavefront errors of the telescope were measured with an interferometer from outside a liquid-helium chamber; a 75-cm reflecting flat mirror was used for auto-collimating the light from the interferometer. The cryogenic deformation of the flat mirror was derived independently by shifting it in the chamber and its contribution to the wavefront error was removed. In addition to the ASTRO-F telescope, we are currently developing a 3.5-m telescope system for SPICA, the next Japanese infrared astronomical satellite project. Details of our methodology for the ASTRO-F telescope, together with our optical test plan for the SPICA telescope, are reported.

Paper Details

Date Published: 19 October 2005
PDF: 15 pages
Proc. SPIE 5965, Optical Fabrication, Testing, and Metrology II, 59650X (19 October 2005); doi: 10.1117/12.624798
Show Author Affiliations
Hidehiro Kaneda, Japan Aerospace Exploration Agency (Japan)
Takashi Onaka, Univ. of Tokyo (Japan)
Takao Nakagawa, Japan Aerospace Exploration Agency (Japan)
Keigo Enya, Japan Aerospace Exploration Agency (Japan)
Hiroshi Murakami, Japan Aerospace Exploration Agency (Japan)
Ryoji Yamashiro, NIKON Corp. (Japan)
Tatsuhiko Ezaki, NIKON Corp. (Japan)
Yasuyuki Numao, NIKON Corp. (Japan)
Yoshikazu Sugiyama, NIKON Corp. (Japan)

Published in SPIE Proceedings Vol. 5965:
Optical Fabrication, Testing, and Metrology II
Angela Duparré; Roland Geyl; Lingli Wang, Editor(s)

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