Share Email Print

Proceedings Paper

Temporally-resolved area-imaged velocimeter system for dynamic materials experiments
Author(s): Thomas E. Tierney IV; Damian C. Swift; Billy N. Vigil; Dennis L. Paisley; Sheng-Nian Luo; Randall P. Johnson; Samuel A. Letzring
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Shocks extending across crystals' grain boundaries can nucleate and grow velocity fluctuations on the order of 5-10% when the shock speeds differ in the adjacent grains. Dynamic materials experiments at the Los Alamos National Laboratory Trident Laser Laboratory aim to examine this phenomenon by temporally- and spatially-resolving free surface velocity over a large region of interest. While line-imaged velocimetry can serve as a quantitative method for examining the velocity fluctuations across a single boundary, it is more desirable to resolve the velocity field around an entire embedded grain. We present a novel diagnostic design that utilizes a four-frame gated-optical-imaging interferometric velocimeter in combination with a streaked line-imaging interferometric velocimeter. This diagnostic will provide high-spatial resolution velocigraphs of a shock as it hits a free surface in multigrain crystals.

Paper Details

Date Published: 21 September 2005
PDF: 8 pages
Proc. SPIE 5920, Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications, 59200Z (21 September 2005); doi: 10.1117/12.622285
Show Author Affiliations
Thomas E. Tierney IV, Los Alamos National Lab. (United States)
Damian C. Swift, Los Alamos National Lab. (United States)
Billy N. Vigil, Los Alamos National Lab. (United States)
Dennis L. Paisley, Los Alamos National Lab. (United States)
Sheng-Nian Luo, Los Alamos National Lab. (United States)
Randall P. Johnson, Los Alamos National Lab. (United States)
Samuel A. Letzring, Los Alamos National Lab. (United States)

Published in SPIE Proceedings Vol. 5920:
Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications
Zenghu Chang; Stuart Kleinfelder; Dennis L. Paisley; Jean-Claude Kieffer; Jerome B. Hastings, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?