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Proceedings Paper

Beam profiling monitors beam shaping
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Paper Abstract

Evaluating the success of beam shaping techniques requires the measurement of the resulting beam profile. Laser beam profilers have been used extensively throughout the laser industry to enable users to evaluate the "quality" of their laser beam. Profilers have made many strides in recent technology, including new cameras, new beam sampling optics, new calculation algorithms, and new profile displays. New cameras include high resolution, megapixel arrays, digital CCDs, FireWire cameras, and phosphor coated CCDs for extending near IR response. Improved beam sampling optics includes components for eliminating polarization effects and optics for sampling high power multi-kilowatt YAG and CO2 lasers. In recent years ISO has refined calculation definitions for measurement of beam width, divergence, flattop beams, and many others, thus standardizing laser profile characterization. Beam profile displays in both 2D and 3D have been improved to provide more intuitive insight.

Paper Details

Date Published: 29 August 2005
PDF: 11 pages
Proc. SPIE 5876, Laser Beam Shaping VI, 587604 (29 August 2005); doi: 10.1117/12.620827
Show Author Affiliations
Carlos B. Roundy, Spiricon, Inc. (United States)
Larry Green, Spiricon, Inc. (United States)

Published in SPIE Proceedings Vol. 5876:
Laser Beam Shaping VI
Fred M. Dickey; David L. Shealy, Editor(s)

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