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Proceedings Paper

Scintillation quantification during the VAMPIRA '04 field campaign
Author(s): Dimitris Tsintikidis; Stephen Doss-Hammel; Mike Jablecki; Crescentia Miscisin; Ike Bendall
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Paper Abstract

An infrared (IR) signal propagating along a 'line-of-sight' horizontal or slant path near the earth's surface can encounter substantial perturbations. These perturbations result in refractive distortions (low-frequency modulations that can amplify or reduce a signal) and scintillation (a higher frequency fluctuation in signal intensity). Scintillation impacts the ability of IR systems to detect high-speed, sea-skimming missiles that are a serious threat to Navy assets. Scintillation is quantified by the refractive index structure parameter Cn2. An opportunity to quantify scintillation occurred during the Validation Measurement for Propagation in the Infrared and Radar (VAMPIRA) field test at Surendorf, Germany, during March - April 2004. Scintillation measurements were made along a slant, near-sea surface path of about 8200 m with a transmissometer that operated in the mid-IR regime. At the same time an AMBER camera system was used to obtain images of stationary lights at the mid-IR. The purpose of this paper is to present several ways of obtaining Cn2 by using either the SSC transmissometer or the AMBER imagery.

Paper Details

Date Published: 18 August 2005
PDF: 9 pages
Proc. SPIE 5891, Atmospheric Optical Modeling, Measurement, and Simulation, 589105 (18 August 2005); doi: 10.1117/12.619499
Show Author Affiliations
Dimitris Tsintikidis, Space and Naval Warfare Systems Ctr.-San Diego (United States)
Stephen Doss-Hammel, Space and Naval Warfare Systems Ctr.-San Diego (United States)
Mike Jablecki, Space and Naval Warfare Systems Ctr.-San Diego (United States)
Crescentia Miscisin, Univ. of California/San Diego in La Jolla (United States)
Ike Bendall, Space and Naval Warfare Systems Ctr.-San Diego (United States)

Published in SPIE Proceedings Vol. 5891:
Atmospheric Optical Modeling, Measurement, and Simulation
Stephen M. Doss-Hammel; Anton Kohnle, Editor(s)

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