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Proceedings Paper

Phase contrast micro-CT with an ultrafast laser-based x-ray source
Author(s): R. Toth; J. C. Kieffer; A. Krol; S. Fourmaux; T. Ozaki; H. Ye; R. E Kincaid Jr.; A. Rakhman
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Paper Abstract

We investigated performance of ultrafast laser-based x-ray source for phase contrast imaging in 2D projection imaging and in enhanced micro-CT imaging. Good quality images were obtained, including images of small animals, in the single energy and multiple energy, in line phase-contrast enhancing geometry using x-ray line energy matching object thickness and density. Phase information has been inferred from images obtained at the same x-ray energy but at different object-to-detector distances and also from images obtained at the same object-to-detector distance but with different K-alpha line energies. Ultrafast laser-based, compact, x-ray source is a promising technique for micro-CT systems. Its utilization might result in faster scans with lower radiation dose, better spatial and contrast resolution and also femtosecond temporal resolution. In addition, it might allow practical implementation of dual-energy and phase-contrast imaging micro-CT that is not possible with conventional micro-CT.

Paper Details

Date Published: 10 September 2005
PDF: 8 pages
Proc. SPIE 5918, Laser-Generated, Synchrotron, and Other Laboratory X-Ray and EUV Sources, Optics, and Applications II, 591813 (10 September 2005);
Show Author Affiliations
R. Toth, INRS-emt, Univ. du Quebec (Canada)
J. C. Kieffer, INRS-emt, Univ. du Quebec (Canada)
A. Krol, SUNY Upstate Medical Univ. (United States)
S. Fourmaux, INRS-emt, Univ. du Quebec (Canada)
T. Ozaki, INRS-emt, Univ. du Quebec (Canada)
H. Ye, Upstate Medical Univ./SUNY (United States)
R. E Kincaid Jr., SUNY Upstate Medical Univ. (United States)
A. Rakhman, SUNY Upstate Medical Univ. (United States)


Published in SPIE Proceedings Vol. 5918:
Laser-Generated, Synchrotron, and Other Laboratory X-Ray and EUV Sources, Optics, and Applications II
George A. Kyrala; Jean-Claude J. Gauthier; Carolyn A. MacDonald; Ali M. Khounsary, Editor(s)

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