Share Email Print

Proceedings Paper

Modeling and characterization of adaptive microlenses: focal length measurement using z-scan
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In the second paper of two papers that address the modeling and characterization of adaptive microlenses, we report the theoretical basis for characterization of such lenses based on the z-scan method. In addition we compare the experimental measurement results with the simulated results obtained using Finite Element Analysis (FEA) utilizing FEMLABTM in the first paper. Some of the method advantages and limitations will be briefly addressed.

Paper Details

Date Published: 18 August 2005
PDF: 7 pages
Proc. SPIE 5874, Current Developments in Lens Design and Optical Engineering VI, 58740E (18 August 2005); doi: 10.1117/12.617689
Show Author Affiliations
Yasser A. Abdelaziez, Univ. of Dayton (United States)
Partha P. Banerjee, Univ. of Dayton (United States)

Published in SPIE Proceedings Vol. 5874:
Current Developments in Lens Design and Optical Engineering VI
Pantazis Z. Mouroulis; Warren J. Smith; R. Barry Johnson, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?