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Proceedings Paper

Automated three-axis gonioreflectometer for computer graphics applications
Author(s): Hongsong Li; Sing Choong Foo; Kenneth E. Torrance; Stephen H. Westin
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Paper Abstract

We describe an automated three-axis BRDF measurement instrument that can help increase the physical realism of computer graphics images by providing light scattering data for the surfaces within a synthetic scene that is to be rendered. To our knowledge, the instrument is unique in combining wide angular coverage (beyond 85° from the surface normal), dense sampling of the visible wavelength spectrum (1024 samples), and rapid operation (less than ten hours for complete measurement of an isotropic sample). The gonioreflectometer employs a broadband light source and a detector with a diffraction grating and linear diode array. Validation was achieved by comparisons against reference surfaces and other instruments. The accuracy and spectral and angular ranges of the BRDFs are appropriate for computer graphics imagery, while reciprocity and energy conservation are preserved. Measured BRDFs on rough aluminum, metallic silver automotive paint, and a glossy yellow paint are reported, and an example rendered automotive image is included.

Paper Details

Date Published: 18 August 2005
PDF: 11 pages
Proc. SPIE 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II, 58780S (18 August 2005); doi: 10.1117/12.617589
Show Author Affiliations
Hongsong Li, Cornell Univ. (United States)
Sing Choong Foo, Cornell Univ. (United States)
Kenneth E. Torrance, Cornell Univ. (United States)
Stephen H. Westin, Cornell Univ. (United States)

Published in SPIE Proceedings Vol. 5878:
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
Angela Duparre; Bhanwar Singh; Zu-Han Gu, Editor(s)

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