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Proceedings Paper

Systematic bias compensation for a moire fringe projection system
Author(s): D. Purcell; A. Samara; A. Davies; F. Farahi
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Paper Abstract

Moire fringe projection techniques are gaining popularity due to their non-contact nature and high accuracy in measuring the surface shape of many objects. The fringe patterns seen when using these instruments are similar to the patterns seen in traditional interferometry but differ in that the spacing between consecutive fringes in traditional interferometry is constant and equal to the wavelength of the source. In moire fringe projection, the spacing (equivalent wavelength) between consecutive fringes may not be constant over the field of view and it depends on the geometry (divergent or parallel) of the set-up. This variation in the equivalent wavelength causes the surface height measurements to be inaccurate. This paper looks at the aberrations that are caused by this varying equivalent wavelength and a calibration process to determine the equivalent wavelength map.

Paper Details

Date Published: 18 August 2005
PDF: 8 pages
Proc. SPIE 5879, Recent Developments in Traceable Dimensional Measurements III, 587909 (18 August 2005); doi: 10.1117/12.614564
Show Author Affiliations
D. Purcell, UNC/Charlotte (United States)
A. Samara, UNC/Charlotte (United States)
A. Davies, UNC/Charlotte (United States)
F. Farahi, UNC/Charlotte (United States)

Published in SPIE Proceedings Vol. 5879:
Recent Developments in Traceable Dimensional Measurements III
Jennifer E. Decker; Gwo-Sheng Peng, Editor(s)

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