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Proceedings Paper

Optical coating considerations for cryogenic mirrors used in AEDC’s 7V and 10V space sensor test chambers
Author(s): H. S. Lowry; W. H. Goethert; S. L. Steely; W. R. Simpson; D. H. Crider; M. F. Breeden
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Paper Abstract

The ground testing of a sensor system under flight conditions is fundamental to characterizing its performance. It should be accomplished early and often in order to manage operational uncertainty and reduce system life-cycle cost. As a DoD Major Range Test Facility Base (MRTFB), the Arnold Engineering Development Center (AEDC) provides a comprehensive capability that strives to ensure system performance evaluations that are not limited by test infrastructure. For over 30 years, the space chambers at AEDC have performed space-sensor characterization, calibration, and mission simulation testing on space-based, interceptor, and airborne sensors. In partnership with Missile Defense Agency (MDA), capability upgrades are continuously pursued to keep pace with evolving sensor technologies. A critical aspect of these chambers is the quality of the mirror coatings used to project simulated target scenes to the unit under test in low-background cryogenic conditions. This paper discusses the recent effort at AEDC to refurbish and/or replace the mirror collimating systems in their 7V and 10V Aerospace Chambers and the coating choices that have been considered.

Paper Details

Date Published: 25 August 2005
PDF: 12 pages
Proc. SPIE 5904, Cryogenic Optical Systems and Instruments XI, 59040R (25 August 2005); doi: 10.1117/12.613377
Show Author Affiliations
H. S. Lowry, Aerospace Testing Alliance (United States)
W. H. Goethert, Aerospace Testing Alliance (United States)
S. L. Steely, Aerospace Testing Alliance (United States)
W. R. Simpson, Aerospace Testing Alliance (United States)
D. H. Crider, Aerospace Testing Alliance (United States)
M. F. Breeden, Aerospace Testing Alliance (United States)

Published in SPIE Proceedings Vol. 5904:
Cryogenic Optical Systems and Instruments XI
James B. Heaney; Lawrence G. Burriesci, Editor(s)

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