Share Email Print
cover

Proceedings Paper

Zeeman laser for straightness measurements
Author(s): Janusz Rzepka; Grzegorz Budzyn; Wojciech Fraczek; Marcin Bielenin
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In the paper we present the prototype of a straightness measuring device that uses a frequency stabilized Zeeman He-Ne laser. The He-Ne laser line is split by Zeeman effect into two circularly polarized laser beams. The frequency of the radiations differ of 1,2 MHz. The surface stabilized ferroelectric liquid crystal cell is used to stabilize the laser frequency. As the result of the laser frequency stabilization the power of both radiation is equal. The circular polarizations of two laser beams are converted into two linear polarizations perpendicular to each other. The two laser beams pass close to the measured axis. Along the axis the analyzing probe is moved. The analyzing probe changes the ratio of the power of the horizontal to the vertical polarization. This ratio is analyzed by the receiver composed of the ferroelectric liquid crystal switcher, the polarizer and the detector. The straightness of 2 m long optical bench was measured with this techniques. The resolution of 0,1 μm and the accuracy of 0.5 μm were obtained. The accuracy of presented technique is not so good as in the methods using laser interferometer but is comparable with methods using PSD, quadrant detectors or CCD at the same time offering bigger resolution.

Paper Details

Date Published: 13 June 2005
PDF: 7 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612658
Show Author Affiliations
Janusz Rzepka, Wroclaw Univ. of Technology (Poland)
Grzegorz Budzyn, Wroclaw Univ. of Technology (Poland)
Wojciech Fraczek, Research and Development Co. Lasertex Ltd. (Poland)
Marcin Bielenin, Research and Development Co. Lasertex Ltd. (Poland)


Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

© SPIE. Terms of Use
Back to Top