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Proceedings Paper

Mapping of surface refractive-index distribution by reflection SNOM
Author(s): Ilya P. Radko; Valentyn S. Volkov; Sergey I. Bozhevolnyi; Jes Henningsen; Jens Pedersen
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Paper Abstract

Scanning near-field optical microscopy (SNOM) in reflection is employed for high-resolution mapping of surface refractive-index distributions. Two different single-mode optical fibers with step-index profiles are characterized using a reflection SNOM setup, in which cross-polarized detection is employed to increase the contrast in optical images and, thereby, the method sensitivity. The SNOM images exhibit a clear ring-shaped structure associated with the fiber stepindex profile, indicating that surface refractive-index variations being smaller than 10-2 can be detected. It is found that the quantitative interpretation of SNOM images requires accurate characterization of a fiber tip used, because the detected optical signal is a result of interference between the optical fields reflected by the sample surface and by the fiber tip itself. The possibilities and limitations of this experimental technique are discussed.

Paper Details

Date Published: 29 August 2005
PDF: 7 pages
Proc. SPIE 5858, Nano- and Micro-Metrology, 585807 (29 August 2005); doi: 10.1117/12.612554
Show Author Affiliations
Ilya P. Radko, Aalborg Univ. (Denmark)
Valentyn S. Volkov, Aalborg Univ. (Denmark)
Sergey I. Bozhevolnyi, Aalborg Univ. (Denmark)
Jes Henningsen, Danish Institute of Fundamental Metrology (Denmark)
Jens Pedersen, Koheras A/S (Denmark)

Published in SPIE Proceedings Vol. 5858:
Nano- and Micro-Metrology
Heidi Ottevaere; Peter DeWolf; Diederik S. Wiersma, Editor(s)

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