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Proceedings Paper

The focusing action of refractive microlens by rigorous method
Author(s): Juan Liu; Ben-Yuan Gu D.V.M.; Bi-Zhen Dong; Guo-Zhen Yang
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Paper Abstract

We investigate the focusing action of refractive microlens based on the rigorous electromagnetic theory by boundary element method. We numerically simulate total electric-field patterns, the electric-field intensity distributions on the focal plane, and their diffractive efficiencies at the focal spots for describing the focusing behaviours of these microlenses with continuous and multilevel surface-envelopes. Focusing action of incident beam with a certain angle of inclination is indagated as well. The present numerical and graphical results may provide an useful information for the analysis and the design of refractive elements in micro-optics.

Paper Details

Date Published: 13 June 2005
PDF: 11 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612490
Show Author Affiliations
Juan Liu, Beijing Jiaotong Univ. (China)
Institute of Physics, CAS (China)
Ben-Yuan Gu D.V.M., Institute of Physics, CAS (China)
Bi-Zhen Dong, Institute of Physics, CAS (China)
Guo-Zhen Yang, Institute of Physics, CAS (China)

Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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