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Proceedings Paper

Corner cube model for Microarcsec Metrology (MAM) testbed in Space Interferometer Mission (SIM)
Author(s): Xu Wang
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Paper Abstract

A corner cube model is developed to calculate the SIM internal metrology optical delay bias (with the accuracy of picometer) due to the component imperfections, such as vertex offset, coating index error, dihedral error, and gimbal offset. This physics-based and Matlab-implemented ray-trace model provides useful guidance on the flight system design, integration, and characterization. In this paper, the details of the corner cube model will be described first. Then the sub-nanometer level model validation through the MAM testbed will be presented. Finally several examples of the model application, such as the metrology delay bias minimization, design parameter error budget (or tolerance) allocation, and the metrology beam prints visualization, will be shown.

Paper Details

Date Published: 14 February 2005
PDF: 14 pages
Proc. SPIE 5776, Eighth International Symposium on Laser Metrology, (14 February 2005); doi: 10.1117/12.611625
Show Author Affiliations
Xu Wang, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 5776:
Eighth International Symposium on Laser Metrology
R. Rodriguez-Vera; F. Mendoza-Santoyo, Editor(s)

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