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Proceedings Paper

Experimental comparison of different oscillation-based test techniques in an analog block
Author(s): Kay Suenaga; Rodrigo Picos; Sebastia Bota; Miquel Roca; Eugeni Garcia-Moreno
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Paper Abstract

This paper experimentally analyses the capabilities of an Oscillation-Based Test technique for diagnosis purposes. To evaluate the feasibility of this test strategy, the technique is applied to an Operational Transconductance Amplifier with fault injection capabilities. The application of this methodology has low impact on circuit performances. Voltage and current magnitude have been considered as test observables. The effects of catastrophic and parametric defects (bridges, opens and shorts) are analyzed in this work. Results show that by a right choice of the test observable, this technique provides high fault coverage levels even in the case of process variations.

Paper Details

Date Published: 30 June 2005
PDF: 9 pages
Proc. SPIE 5837, VLSI Circuits and Systems II, (30 June 2005); doi: 10.1117/12.608801
Show Author Affiliations
Kay Suenaga, Univ. de les Illes Balears (Spain)
Rodrigo Picos, Univ. de les Illes Balears (Spain)
Sebastia Bota, Univ. de les Illes Balears (Spain)
Miquel Roca, Univ. de les Illes Balears (Spain)
Eugeni Garcia-Moreno, Univ. de les Illes Balears (Spain)

Published in SPIE Proceedings Vol. 5837:
VLSI Circuits and Systems II
Jose Fco. Lopez; Francisco V. Fernandez; Jose Maria Lopez-Villegas; Jose M. de la Rosa, Editor(s)

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