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Proceedings Paper

Analysis and simulation of noise in correlated double sampling imager circuits
Author(s): Leonard Forbes; Harish Gopalakrishnan; Weetit Wanalertlak
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Paper Abstract

Noise is an important factor in determining the sensitivity of CMOS imagers at low light levels. Both device or transistor thermal noise and l/f noise are contributing factors, correlated double sampling reduces the effect of both thermal noise and l/f noise but is less effective in reducing l/f noise as sampling time increases. Techniques to simulate noise in sampling circuits have only recently become available and are compared here to the older analytical techniques.

Paper Details

Date Published: 23 May 2005
PDF: 10 pages
Proc. SPIE 5844, Noise in Devices and Circuits III, (23 May 2005); doi: 10.1117/12.608761
Show Author Affiliations
Leonard Forbes, Oregon State Univ. (United States)
Harish Gopalakrishnan, Oregon State Univ. (United States)
Weetit Wanalertlak, Oregon State Univ. (United States)

Published in SPIE Proceedings Vol. 5844:
Noise in Devices and Circuits III
Alexander A. Balandin; Francois Danneville; M. Jamal Deen; Daniel M. Fleetwood, Editor(s)

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