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Proceedings Paper

Voltage to frequency converter for DAC test
Author(s): John Hogan; Ronan Farrell
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Paper Abstract

In this paper a modified relaxation oscillator is proposed as the core of an analog to digital modulator for on chip signal extraction for test. The architecture uses digital current source generation and digital switching in place of active circuitry. The resulting design allows for high input sensitivity, robustness to component variation while occupying little silicon area. This paper provides solutions on the main challenges in implementing this modulator and how it may be integrated with a digital based tester.

Paper Details

Date Published: 30 June 2005
PDF: 12 pages
Proc. SPIE 5837, VLSI Circuits and Systems II, (30 June 2005); doi: 10.1117/12.608479
Show Author Affiliations
John Hogan, National Univ. of Ireland, Maynooth (Ireland)
Ronan Farrell, National Univ. of Ireland, Maynooth (Ireland)

Published in SPIE Proceedings Vol. 5837:
VLSI Circuits and Systems II
Jose Fco. Lopez; Francisco V. Fernandez; Jose Maria Lopez-Villegas; Jose M. de la Rosa, Editor(s)

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